Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images

Title:: Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images
Document type:: Konferenzbeitrag
Author(s):: Pollach, Matthias; Schiegg, Felix; Ludwig, Matthias; Bette, Ann-Christin; Knoll, Alois
Book / Congress title:: 2022 30th European Signal Processing Conference (EUSIPCO)
Publisher:: IEEE
Date of publication:: 29.08.2022
Year:: 2022
Fulltext / DOI:: doi:10.23919/eusipco55093.2022.9909919
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