- Document type:
- Konferenzbeitrag
- Author(s):
- Bette, Ann-Christin and Brus, Patrick and Balazs, Gabor and Ludwig, Matthias and Knoll, Alois
- Title:
- Automated Defect Inspection in Reverse Engineering of Integrated Circuits
- Book / Congress title:
- 2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)
- Year:
- 2022
BibTeX