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- Title:
Gate–Emitter Pre-threshold Voltage as a Health-Sensitive Parameter for IGBT Chip Failure Monitoring in High-Voltage Multichip IGBT Power Modules
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Mandeya, Richard; Chen, Cuili; Pickert, Volker; Naayagi, R. T.; Ji, Bing
- Journal title:
- IEEE Transactions on Power Electronics
- Year:
- 2019
- Journal volume:
- 34
- Journal issue:
- 9
- Pages contribution:
- 9158-9169
- Fulltext / DOI:
- doi:10.1109/tpel.2018.2884276
- Publisher:
- Institute of Electrical and Electronics Engineers (IEEE)
- E-ISSN:
- 0885-89931941-0107
- Date of publication:
- 01.09.2019
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