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- Titel:
Automated Defect Inspection in Reverse Engineering of Integrated Circuits
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Bette, Ann-Christin and Brus, Patrick and Balazs, Gabor and Ludwig, Matthias and Knoll, Alois
- Kongress- / Buchtitel:
- 2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)
- Jahr:
- 2022
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