Omnidirectional antireflective properties of porous Tungsten Oxide films with in-depth variation of void fraction and stoichiometry

Titel:: Omnidirectional antireflective properties of porous Tungsten Oxide films with in-depth variation of void fraction and stoichiometry
Autor(en):: Vourdas, Nikolaos; Dalamagkidis, Konstantinos; Kostis, Ioannis; Vasilopoulou, Maria; Davazoglou, Dimitris
Zeitschriftentitel:: Optics Communications
Jahr:: 2012
Band / Volume:: 285
Heft / Issue:: 24
Seitenangaben Beitrag:: 5229--5234
Volltext / DOI:: doi:10.1016/j.optcom.2012.08.020
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