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Title:

Testing the Resilience of Fail-Operational Systems Early On with Non-Intrusive Data Seeding

Author(s):
Froehlich, Joachim; Frtunikj, Jelena; Knoll, Alois
Book / Congress title:
1st International ESWEEK Workshop on Resiliency in Embedded Electronic System
Publisher:
IEEE
Year:
2015
Month:
October
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