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Title:

An Investigation of Frequency Response Analysis Method for Junction Temperature Estimation of SiC Power Device

Document type:
Konferenzbeitrag
Contribution type:
Poster
Author(s):
Xiang Lu; Cuili Chen; Maher Al-Greer; Volker Pickert; Charalampos Tsimenidis
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
CIPS 2018; 10th International Conference on Integrated Power Electronics Systems
Date of congress:
20.03.2018 - 22.03.2018
Publisher:
VDE
Year:
2018
Year / month:
2018-03
Month:
Mar
Print-ISBN:
978-3-8007-4540-1
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