Statistical dependence of pixel intensities for pattern recognition

Title:: Statistical dependence of pixel intensities for pattern recognition
Document type:: Konferenzbeitrag
Author(s):: Ievgen Smielik and Klaus-Dieter Kuhnert
Keywords:: ml
Dewey Decimal Classification:: 020 Bibliotheks- und Informationswissenschaften
Book / Congress title:: IEEE International Conference on Industrial Technology
Year:: 2013
Covered by:: Scopus
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