Integrated Test Module Design for Microfluidic Large-Scale Integration

Title:: Integrated Test Module Design for Microfluidic Large-Scale Integration
Document type:: Zeitschriftenaufsatz
Author(s):: Li, Mengchu; Zhang, Yushen; Lee, Ju Young; Gasvoda, Hudson; Araci, Ismail Emre; Tseng, Tsun-Ming; Schlichtmann, Ulf
Journal title:: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
Year:: 2023
Journal volume:: 42
Journal issue:: 6
Pages contribution:: 1939 - 1950
Fulltext / DOI:: doi:10.1109/TCAD.2022.3213613
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