Integrated Test Module Design for Microfluidic Large-Scale Integration

Titel:: Integrated Test Module Design for Microfluidic Large-Scale Integration
Dokumenttyp:: Zeitschriftenaufsatz
Autor(en):: Li, Mengchu; Zhang, Yushen; Lee, Ju Young; Gasvoda, Hudson; Araci, Ismail Emre; Tseng, Tsun-Ming; Schlichtmann, Ulf
Zeitschriftentitel:: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
Jahr:: 2023
Band / Volume:: 42
Heft / Issue:: 6
Seitenangaben Beitrag:: 1939 - 1950
Volltext / DOI:: doi:10.1109/TCAD.2022.3213613
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