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Document type:
Zeitschriftenaufsatz
Author(s):
Anik, Md Toufiq Hasan; Danger, Jean-Luc; Diankha, Omar; Ebrahimabadi, Mohammad; Frisch, Christoph; Guilley, Sylvain; Karimi, Naghmeh; Pehl, Michael; Takarabt, Sofiane
Title:
Testing and reliability enhancement of security primitives: Methodology and experimental validation
Abstract:
The test of security primitives is particularly strategic as any bias coming from the implementation or environment can wreak havoc on the security it is intended to provide. This paper presents how some security properties are tested on hardware security primitives including True Random Number Generation (TRNG), Physically Unclonable Function (PUF), and cryptographic modules. Moreover, we discuss how the sensors embedded to protect cryptographic modules against fault injection attacks should be...     »
Keywords:
Test, PUF, High order Alphabet (HoA), TRNG, SCA, FIA, DS, Automatic Test Pattern Generation (ATPG)
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Journal title:
Microelectronics Reliability
Year:
2023
Journal volume:
147
Pages contribution:
115055
Fulltext / DOI:
doi:https://doi.org/10.1016/j.microrel.2023.115055
WWW:
https://www.sciencedirect.com/science/article/pii/S0026271423001555
Print-ISSN:
0026-2714
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