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- Title:
Machine Learning in Advanced IC Design: A Methodological Survey
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Chen, Tinghuan; Zhang, Li; Yu, Bei; Li, Bing; Schlichtmann, Ulf
- Journal title:
- IEEE Design & Test
- Year:
- 2023
- Journal volume:
- 40
- Month:
- February
- Journal issue:
- 1
- Pages contribution:
- 17-33
- Fulltext / DOI:
- doi:10.1109/MDAT.2022.3216799
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