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Title:

Structured Design and Evaluation of a Resistor-Based PUF Robust Against PVT-Variations

Document type:
Konferenzbeitrag
Author(s):
Riehm, Carl and Frisch, Christoph and Burcea, Florin and Hiller, Matthias and Pehl, Michael and Brederlow, Ralf
Pages contribution:
93--98
Abstract:
This paper proposes a new fully CMOS-compatible PUF primitive robust against process variations, supply voltage variations and temperature drift (PVT) based on resistive structures that implements advanced compensation mechanisms already on circuit level. Based on analog simulation data, the PUF is evaluated regarding its unpredictability and its reliability. The results indicate a high quality. Further, a structured approach for designing a suitable error correction is presented to illustrate...     »
Keywords:
Silicon PUF, error orrection, mixed signal
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Congress (additional information):
Tallin, Estonia
Organization:
IEEE
Date of congress:
03.05.-05.05.2023
Year:
2023
Quarter:
2. Quartal
Year / month:
2023-05
Month:
May
Pages:
93--98
WWW:
https://ddecs2023.taltech.ee/
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