Yasmine Abu-Haeyeh*, Thomas Bartelsmeier*, Tobias Ladner*, Matthias Althoff, Lars Hedrich, Markus Olbrich
Formally Verifying Analog Neural Networks With Device Mismatch Variations
Proceedings of the 28th Design, Automation and Test in Europe Conference (DATE)
2025

Lukas Schäfer; Matthias Althoff
Robust Optimal Control Using Set-based Reachability Analysis
submitted to 2025 European Control Conference
2025

Koller, Lukas;Hartmann, Christoph;Martinitz, Lukas;Volk, Wolfram;Althoff, Matthias
Training robust neural networks for uncertainty prediction in stamping technology
at - Automatisierungstechnik
2025
73
3
198-209