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Title:

Understanding Stochastic Behavior of Self-Rectifying Memristors for Error-Corrected Physical Unclonable Functions

Document type:
Zeitschriftenaufsatz
Author(s):
Zhao, Xianyue and Ruchti, Jonas and Frisch, Christoph and Li, Kefeng and Chen, Ziang and Menzel, Stephan and Waser, Rainer and Schmidt, Heidemarie and Polian, Ilia and Pehl, Michae and Du, Nan
Abstract:
Physical Unclonable Functions (PUFs) have gained widespread attention for their secure key storage, authentication, and anti-counterfeiting applications. While traditional PUFs based on Complementary Metal-Oxide-Semiconductor (CMOS) have been extensively studied, the emergence of memristors offers new opportunities due to their inherent device variations and distinctive resistive switching behaviors. This study explores the construction of reliable PUFs using self-rectifying analog BiFeO3...     »
Keywords:
Memristors; Switches; Reliability; Bit error rate; Schottky barriers; Resistance; Device-to-device communication; physical unclonable functions,self-rectifying analog memristor; stochastic behavior; raw bit error rate; error correction; reliability
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Journal title:
IEEE Transactions on Nanotechnology
Year:
2024
Journal volume:
23
Year / month:
2024-06
Quarter:
2. Quartal
Month:
Jun
Pages contribution:
490--499
Fulltext / DOI:
doi:10.1109/TNANO.2024.3413888
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Print-ISSN:
1941-0085
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