Halilovic, Smajil;Böttcher, Fabian;Zosseder, Kai;Hamacher, Thomas
Spatial analysis of thermal groundwater use based on optimal sizing and placement of well doublets
Energy
2024
304
132058

Genssler, Paul R.;Wasif, Sandy A.;Wael, Miran;Novkin, Rodion;Amrouch, Hussam
Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Vmin Testing under Variations: Defect versus Fault Coverage
IEEE Latin American Test Symposium (LATS'24)
2024

Hien, Benjamin;Walter, Marcel;van Santen, Victor M.;Klemme, Florian;Parihar, Shivendra Singh;Pahwa, Girish;Chauhan, Yogesh S.;Amrouch, Hussam;Wille, Robert
Technology Mapping for Cryogenic CMOS Circuits
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Time and Space Optimized Storage-based BIST under Multiple Voltages and Process Variations
IEEE European Test Symposium (ETS'24)
2024

Genssler, Paul;Mayahinia, Mahta;Thomann, Simon;Tahoori, Mehdi;Amrouch, Hussam
Technology/Algorithm Co-design for Reliable Energy-efficient NVM-based Hyperdimensional Computing under Voltage Scaling
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Dennis Reimer, Jan;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing
IEEE International Test Conference (ITC'24)
2024

Zhou, Yifei;Kaempfe, Thomas;Ni, Kai;Amrouch, Hussam;Zhuo, Cheng;Yin, Xunzhao
TReCiM: Lower Power and Temperature-Resilient Multibit 2FeFET-1T Compute-in-Memory Design
IEEE/ACM 42nd International Conference on Computer-Aided Design (ICCAD'24)
2024

Pandaram, Karthik;Amrouch, Hussam;Polian, Ilia
Optimized Detection of Marginal Defects in Standard Cells Using Unsupervised Learning
IEEE The 33rd Asian Test Symposium (ATS'24)
2024

Kar, Anirban;Chauhan. S, Yogesh;Amrouch, Hussam
Innovations in Hardware Security: Leveraging FeFET Technology for Future Opportunities
Proceedings of IEEE Asia Pacific Conference on Circuits and Systems (APCCAS'24)
2024