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- Title:
Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Ng, S. S. H.; Croshaw, J.; Walter, M.; Wille, R.; Wolkow, R.; Walus, K.
- Journal title:
- IEEE Transactions on Nanotechnology (TNANO)
- Year:
- 2024
- Fulltext / DOI:
- doi:10.1109/TNANO.2024.3372946
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