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- Title:
Application of Machine Learning Methods in Post-Silicon Yield Improvement
- Document type:
- Konferenzbeitrag
- Author(s):
- Yigit, Baris; Zhang, Li; Li, Bing; Shi, Yiyu; Schlichtmann, Ulf
- Book / Congress title:
- IEEE International System on Chip Conference (SOCC)
- Year:
- 2017
- Month:
- sep
- CC license:
- by, http://creativecommons.org/licenses/by/4.0
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