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Title:

Reliability-aware Synthesis and Fault Test of Fully Programmable Valve Arrays (FPVAs)

Document type:
Konferenzbeitrag
Author(s):
Li, Bing; Schlichtmann, Ulf
Book / Congress title:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, (Invited Paper)
Congress (additional information):
(Invited Paper)
Year:
2017
Month:
oct
CC license:
by, http://creativecommons.org/licenses/by/4.0
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