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Titel:

DiaSys: Improving SoC insight through on-chip diagnosis

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Philipp Wagner, Thomas Wild, Andreas Herkersdorf
Abstract:
To find the cause of a functional or non-functional defect (bug) in software running on a multi-processor System-on-Chip (MPSoC), developers need insight into the chip. Tracing systems provide this insight non-intrusively, at the cost of high off-chip bandwidth requirements. This I/O bottleneck limits the observability, a problem becoming more severe as more functionality is integrated on-chip. In this paper, we present DiaSys, an MPSoC diagnosis system with the potential to replace today’s trac...     »
Stichworte:
OpTiMSoC
Dewey Dezimalklassifikation:
620 Ingenieurwissenschaften
Zeitschriftentitel:
Journal of Systems Architecture
Jahr:
2017
Jahr / Monat:
2017-01
Reviewed:
ja
Sprache:
en
Volltext / DOI:
doi:10.1016/j.sysarc.2017.01.005
WWW:
http://www.sciencedirect.com/science/article/pii/S1383762117300255
Verlag / Institution:
Elsevier
Status:
Verlagsversion / published
Publikationsdatum:
12.01.2017
TUM Einrichtung:
Lehrstuhl für Integrierte Systeme
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