User: Guest  Login
Title:

DiaSys: Improving SoC insight through on-chip diagnosis

Document type:
Zeitschriftenaufsatz
Author(s):
Philipp Wagner, Thomas Wild, Andreas Herkersdorf
Abstract:
To find the cause of a functional or non-functional defect (bug) in software running on a multi-processor System-on-Chip (MPSoC), developers need insight into the chip. Tracing systems provide this insight non-intrusively, at the cost of high off-chip bandwidth requirements. This I/O bottleneck limits the observability, a problem becoming more severe as more functionality is integrated on-chip. In this paper, we present DiaSys, an MPSoC diagnosis system with the potential to replace today’s trac...     »
Keywords:
OpTiMSoC
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Journal title:
Journal of Systems Architecture
Year:
2017
Year / month:
2017-01
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1016/j.sysarc.2017.01.005
WWW:
http://www.sciencedirect.com/science/article/pii/S1383762117300255
Publisher:
Elsevier
Status:
Verlagsversion / published
Date of publication:
12.01.2017
TUM Institution:
Lehrstuhl für Integrierte Systeme
 BibTeX