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Title:

Lifetime Reliability Optimization for Embedded Systems: A System-Level Approach

Author(s):
Glaß, Michael; Lukasiewycz, Martin; Haubelt, Christian; Teich, Jürgen
Pages contribution:
17--22
Book / Congress title:
Proceedings of the International Workshop on Reliability Aware System Design and Test (RASDAT)
Publisher address:
Bangalore, India
Year:
2010
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