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Document type:
Konferenzbeitrag 
Author(s):
Lippmann, Bernhard and Ludwig, Matthias and Mutter, Johannes and Bette, Ann-Christin and Hepp, Alexander and Baehr, Johanna and Rasche, Martin and Kellermann, Oliver and Gieser, Horst and Zweifel, Tobias and Kovac, Nicola 
Title:
Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions 
Abstract:
Motivated by the threats of malicious modification and piracy arising from worldwide distributed supply chains, the goal of RESEC is the creation, verification, and optimization of a complete reverse engineering process for integrated circuits manufactured in technology nodes of 40 nm and below. Building upon the presentation of individual reverse engineering process stages, this paper connects analysis efforts and yields with their impact on hardware security, demonstrated on a design wi...    »
 
Keywords:
Hardware Reverse Engineering, Layout Extraction, SEM Imaging, Image Processing, RISC-V, Hardware Trojans 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
2022 Design, Automation & Test in Europe Conference & Exhibition DATE 
Congress (additional information):
Antwerp, Belgium 
Publisher:
IEEE 
Publisher address:
Antwerp, Belgium 
Year:
2022 
Quarter:
1. Quartal 
Year / month:
2022-03 
Month:
Mar 
Reviewed:
ja 
Language:
en