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- Titel:
A Cross-Layer Approach to Measure the Robustness of Integrated Circuits
- Autor(en):
- Barke, Martin; Schlichtmann, Ulf
- Zeitschriftentitel:
- ACM Journal on Emerging Technologies in Computing Systems (JETC) - Special Issue on Cross-Layer System Design and Regular Papers
- Jahr:
- 2015
- Band / Volume:
- 12
- Monat:
- sep
- Heft / Issue:
- 3
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