- Title:
Technology-Aware System Failure Analysis in the Presence of Soft Errors by Mixture Importance Sampling
- Author(s):
- Kleeberger, Veit B.; Mueller-Gritschneder, Daniel; Schlichtmann, Ulf
- Book / Congress title:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Year:
- 2013
- Month:
- oct
- BibTeX