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Titel:

Technology-Aware System Failure Analysis in the Presence of Soft Errors by Mixture Importance Sampling

Autor(en):
Kleeberger, Veit B.; Mueller-Gritschneder, Daniel; Schlichtmann, Ulf
Kongress- / Buchtitel:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Jahr:
2013
Monat:
oct
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