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- Title:
Temperature distribution in multichip IGBT module and its impact on collector current sharing
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Chen, Cuili; Pickert, Volker; Al-Greer, Maher; Wang, Zhiqiang; Knoll, Alois Christian
- Journal title:
- Microelectronics Reliability
- Year:
- 2023
- Journal volume:
- 143
- Pages contribution:
- 114935
- Fulltext / DOI:
- doi:10.1016/j.microrel.2023.114935
- Publisher:
- Elsevier BV
- E-ISSN:
- 0026-2714
- Date of publication:
- 01.04.2023
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