FeFET Reliability Modeling for In-Memory Computing: Challenges, Perspective, and Emerging Trends

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Title:: FeFET Reliability Modeling for In-Memory Computing: Challenges, Perspective, and Emerging Trends
Document type:: Zeitschriftenaufsatz
Author(s):: Thomann, Simon; Amrouch, Hussam
Journal title:: IEEE Transactions on Electron Devices (TED)
Year:: 2023
Journal volume:: PP
Month:: 01
Pages contribution:: 1-7
Fulltext / DOI:: doi:10.1109/TED.2023.3313112
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