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- Title:
Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Towards Radiation-Tolerant Embedded Nonvolatile Memory
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Jiang, Zhouhang; Guo, Zixiang; Luo, Xuyi; Sayed, Munazza; Faris, Zubair; Mulaosmanovic, Halid; Dünkel, Stefan; Soss, Steven; Beyer, Sven; Gong, Xiao; Kurinec, Santosh; Narayanan, Vijaykrishnan; Amrouch, Hussam; Zhang, En; Fleetwood, Daniel; Schrimpf, Ronald; Ni, Kai
- Journal title:
- IEEE Electron Device Letters (EDL)
- Year:
- 2023
- Journal volume:
- PP
- Month:
- 01
- Pages contribution:
- 1-1
- Fulltext / DOI:
- doi:10.1109/LED.2023.3332071
BibTeX
Occurrences:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandHochschulbibliographie2023Schools und FakultätenTUM School of Computation, Information and TechnologyAI Processor Design (Prof. Amrouch)