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- Title:
Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level
- Document type:
- Konferenzbeitrag
- Author(s):
- Ranjbar, Behnaz; Klemme, Florian; Genssler, Paul R.; Amrouch, Hussam; Jung, Jinhyo; Dave, Shail; So, Hwisoo; Lee, Kyongwoo; Shrivastava, Aviral; Lin, Ji-Yung; Weckx, Pieter; Mishra, Subrat; Catthoor, Francky; Biswas, Dwaipayan; Kumar, Akash
- Book / Congress title:
- 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
- Year:
- 2023
- Pages:
- 1-10
- Fulltext / DOI:
- doi:10.23919/DATE56975.2023.10137182
BibTeX
Occurrences:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)