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- Title:
Voltage Over-Scaling in Sequential Circuits for Approximate Computing
- Document type:
- Konferenzbeitrag
- Author(s):
- David May, Walter Stechele
- Keywords:
- Soft Error Rate Estimation
- Dewey Decimal Classification:
- 620 Ingenieurwissenschaften
- Book / Congress title:
- Design &Technology of Integrated Systems in Nanoscale Era
- Date of congress:
- April 12-14
- Year:
- 2016
- Year / month:
- 2016-04
- TUM Institution:
- Lehrstuhl für Integrierte Systeme
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