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Title:

Computing Worst-Case Performance and Yield of Analog Integrated Circuits by Means of Mesh Adaptive Direct Search

Author(s):
Bürmen, Arpad; Habal, Husni
Journal title:
Informacije MIDEM, Journal of Microelectronics, Electronic Components and Materials
Year:
2015
Journal volume:
45
Journal issue:
2
Pages contribution:
160-170
Notes:
http://www.midem-drustvo.si/Journal http://www.midem-drustvo.si/journal/Issues.aspx
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