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- Title:
A Cross-Layer Approach to Measure the Robustness of Integrated Circuits
- Author(s):
- Barke, Martin; Schlichtmann, Ulf
- Journal title:
- ACM Journal on Emerging Technologies in Computing Systems (JETC) - Special Issue on Cross-Layer System Design and Regular Papers
- Year:
- 2015
- Journal volume:
- 12
- Month:
- sep
- Journal issue:
- 3
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