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- Title:
Statistical Timing Analysis and Criticality Computation for Circuits With Post-Silicon Clock Tuning Elements
- Author(s):
- Li, Bing; Schlichtmann, Ulf
- Journal title:
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Year:
- 2015
- Month:
- nov
- Fulltext / DOI:
- doi:10.1109/TCAD.2015.2432143
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