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- Title:
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller- Gritschneder, Sani Nassif, Ulf Schlichtmann, Norbert Wehn
- Keywords:
- VirTherm 3D
- Dewey Decimal Classification:
- 620 Ingenieurwissenschaften
- Journal title:
- IEEE Micro
- Year:
- 2013
- Journal volume:
- Volume 33
- Year / month:
- 2013-07
- Month:
- Jul
- Journal issue:
- Number 4
- Language:
- en
- TUM Institution:
- Lehrstuhl für Integrierte Systeme
- Format:
- Text
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