- Titel:
Technology-Aware System Failure Analysis in the Presence of Soft Errors by Mixture Importance Sampling
- Autor(en):
- Kleeberger, Veit B.; Mueller-Gritschneder, Daniel; Schlichtmann, Ulf
- Kongress- / Buchtitel:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Jahr:
- 2013
- Monat:
- oct
- BibTeX