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- Title:
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits
- Document type:
- Konferenzbeitrag
- Author(s):
- van Santen, Victor; Klemme, Florian; Genssler, Paul; Amrouch, Hussam
- Book / Congress title:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
- Year:
- 2023
- Month:
- 10
- Pages:
- 1-6
- Fulltext / DOI:
- doi:10.1109/DFT59622.2023.10313528
BibTeX
Occurrences:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandHochschulbibliographie2023Schools und FakultätenTUM School of Computation, Information and TechnologyAI Processor Design (Prof. Amrouch)