Login
- Titel:
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- van Santen, Victor; Klemme, Florian; Genssler, Paul; Amrouch, Hussam
- Kongress- / Buchtitel:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
- Jahr:
- 2023
- Monat:
- 10
- Seiten:
- 1-6
- Volltext / DOI:
- doi:10.1109/DFT59622.2023.10313528
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)