- Document type:
- Konferenzbeitrag
- Author(s):
- van Santen, Victor; Gata-Romero, Jose; Nunez, Juan; Castro-Lopez, Rafael; Roca, Elisenda; Amrouch, Hussam
- Title:
- Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths
- Book / Congress title:
- 2023 IEEE International Reliability Physics Symposium (IRPS)
- Year:
- 2023
- Month:
- 03
- Pages:
- 1-6
- Fulltext / DOI:
- doi:10.1109/IRPS48203.2023.10117751
- BibTeX