U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors.

Title:: U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors.
Document type:: Konferenzbeitrag
Author(s):: Kälber, Florian; Köpüklü, Okan; Lehment, Nicolas H; Rigoll, Gerhard
Book / Congress title:: VISIGRAPP (5: VISAPP)
Year:: 2021
Pages:: 593--601
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