U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors.

Titel:: U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors.
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Kälber, Florian; Köpüklü, Okan; Lehment, Nicolas H; Rigoll, Gerhard
Kongress- / Buchtitel:: VISIGRAPP (5: VISAPP)
Jahr:: 2021
Seiten:: 593--601
BibTeX