- Title:
Correctable Erasure Patterns in Product Topologies
- Document type:
- Konferenzbeitrag
- Author(s):
- Holzbaur, Lukas; Puchinger, Sven; Yaakobi, Eitan; Wachter-Zeh, Antonia
- Book / Congress title:
- IEEE International Symposium on Information Theory (ISIT)
- Organization:
- IEEE
- Year:
- 2021
- BibTeX