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Title:

ViTaL: Verifying Trojan-Free Physical Layouts through Hardware Reverse Engineering

Document type:
Konferenzbeitrag
Author(s):
Ludwig, Matthias and Bette, Ann-Christin and Lippmann, Bernhard
Abstract:
The semiconductor industry is heavily relying on outsourcing of design, fabrication, and testing to third parties. The threat of possibly malicious actors in this ramified supply-chain poses a risk for the integrity of integrated circuits (ICs) and hardware Trojans (HTs) are a heavily discussed topic in academia and the industry. A variety of pre- and post-silicon HT prevention and detection techniques has been suggested in prior works. Hardware reverse engineering has the potential to detect po...     »
Keywords:
hardware trust, hardware RE, physical layout verification, layout HT detection, design-for-manufacturability, feature extraction
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE)
Congress (additional information):
Washington DC, US
Publisher address:
Washington DC, US
Year:
2021
Quarter:
4. Quartal
Year / month:
2021-11
Month:
Nov
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1109/PAINE54418.2021.9707702
WWW:
https://ieeexplore.ieee.org/document/9707702
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