Anik, Md Toufiq Hasan and Danger, Jean-Luc and Diankha, Omar and Ebrahimabadi, Mohammad and Frisch, Christoph and Guilley, Sylvain and Karimi, Naghmeh and Pehl, M. and Takarabt, Sofiane
Testing and Reliability Enhancement of Security Primitives
DFT 2021 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Athens, Greece
2021