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- Titel:
Meta-model Based Automation of Properties for Pre-Silicon Verification
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Devarajegowda, Keerthikumara; Ecker, Wolfgang
- Kongress- / Buchtitel:
- IFIP International Conference on Very Large Scale Integration (VLSI)
- Jahr:
- 2018
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