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Title:

Closing the gap between speed and configurability of multi-bit fault emulation environments for security and safety–critical designs

Document type:
Zeitschriftenaufsatz
Author(s):
Nyberg, Ralph and Heyszl, Johann and Rabe, Dirk and Sigl, Georg
Abstract:
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount of multi-bit fault occurrences, e.g., during fault attacks against cryptographic implementations. Therefore, multi-bit fault injection becomes more important during security and safety verification. Fault injection techniques which are applicable during the development cycle of a device are based on either software implementations, e.g. formal methods and simulations, or fault emulation environment...     »
Keywords:
FPGA-based fault emulation; Multi-bit faults; Performance optimization; Configurability; Result evaluation
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Journal title:
Microprocessors and Microsystems
Year:
2015
Year / month:
2015-05
Quarter:
2. Quartal
Month:
May
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1016/j.micpro.2015.05.015
WWW:
http://www.sciencedirect.com/science/article/pii/S0141933115000678
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