Login
- Title:
Improving the Significance of Probabilistic Circuit Fault Emulations
- Document type:
- Konferenzbeitrag
- Contribution type:
- Textbeitrag / Aufsatz
- Author(s):
- David May, Walter Stechele
- Keywords:
- Soft Error Rate Estimation, RELY
- Dewey Decimal Classification:
- 620 Ingenieurwissenschaften
- Book / Congress title:
- 20th IEEE International On-Line Testing Symposium (IOLTS)
- Year:
- 2014
- Year / month:
- 2014-07
- Month:
- Jul
- Language:
- en
- TUM Institution:
- Lehrstuhl für Integrierte Systeme
BibTeX