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Title:

Technology-Aware System Failure Analysis in the Presence of Soft Errors by Mixture Importance Sampling

Author(s):
Kleeberger, Veit B.; Mueller-Gritschneder, Daniel; Schlichtmann, Ulf
Book / Congress title:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Year:
2013
Month:
oct
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