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Title:

Improving the Significance of Probabilistic Circuit Fault Emulations

Document type:
Konferenzbeitrag
Contribution type:
Textbeitrag / Aufsatz
Author(s):
David May, Walter Stechele
Keywords:
Soft Error Rate Estimation, RELY
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
20th IEEE International On-Line Testing Symposium (IOLTS)
Year:
2014
Year / month:
2014-07
Month:
Jul
Language:
en
TUM Institution:
Lehrstuhl für Integrierte Systeme
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