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Title:

A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience

Document type:
Zeitschriftenaufsatz
Author(s):
Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller- Gritschneder, Sani Nassif, Ulf Schlichtmann, Norbert Wehn
Keywords:
VirTherm 3D
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Journal title:
IEEE Micro
Year:
2013
Journal volume:
Volume 33
Year / month:
2013-07
Month:
Jul
Journal issue:
Number 4
Language:
en
TUM Institution:
Lehrstuhl für Integrierte Systeme
Format:
Text
 BibTeX